ToF-SIMS imaging and depth profiling of HeLa cells treated with bromodeoxyuridine
نویسندگان
چکیده
منابع مشابه
C60-ToF SIMS imaging of frozen hydrated HeLa cells.
Sample preparation continues to be a major challenge for secondary ion mass spectrometry studies of biological materials. Maintaining the native hydrated state of the material is important for preserving both chemical and spatial information. Here, we discuss a method which combines a sample wash and dry protocol discussed by Berman et al1 (1) followed by plunge freezing in liquid ethane for a ...
متن کاملDepth profiling of peptide films with TOF-SIMS and a C60 probe.
A buckminsterfullerene ion source is employed to characterize peptide-doped trehalose thin films. The experiments are designed to utilize the unique sputtering properties of cluster ion beams for molecular depth profiling. The results show that trehalose films with high uniformity can be prepared on Si by a spin-coating technique. Bombardment of the film with C60+ results in high quality time-o...
متن کاملToF-SIMS Depth Profiling of a Complex Polymeric Coating Employing a C60 Sputter Source
A complex poly(vinylidene difluoride) (PVdF)/poly(methyl methacrylate) (PMMA) based coil coating formulation has been investigated using time-of-flight SIMS (ToFSIMS). Employing a Bi3 + analysis source and a Buckminsterfullerene (C60) sputter source, depth profiles were obtained through the polymeric materials in the outer few nanometres of the PVdF topcoat. These investigations demonstrate tha...
متن کاملSputter Depth Profiling by SIMS; Calibration of SIMS Depth Scale Using Multi-layer Reference Materials
In-depth distribution of doping elements in shallow depth region is an important role of secondary ion mass spectrometry (SIMS) for the development of next-generation semiconductor devices. KRISS has developed two types of multi-layer reference materials by ion beam sputter deposition. A multiple delta-layer reference material where the layers of one element are very thin can be used to evaluat...
متن کاملSpatiotemporal lipid profiling during early embryo development of Xenopus laevis using dynamic ToF-SIMS imaging.
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) imaging has been used for the direct analysis of single intact Xenopus laevis embryo surfaces, locating multiple lipids during fertilization and the early embryo development stages with subcellular lateral resolution (∼4 μm). The method avoids the complicated sample preparation for lipid analysis of the embryos, which requires selective ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Surface and Interface Analysis
سال: 2010
ISSN: 0142-2421
DOI: 10.1002/sia.3415